Combinatorial Model-Based Test Program Generation for Microprocessors
نویسنده
چکیده
In this paper we describe a method of automated test program generation intended for systematic functional verification of microprocessors. The method supplements such widely-spread practical approaches as software-based verification and random generation. In our method, construction of test programs is based on microprocessor model, which includes structural model and instruction set model. The goal of generation is defined by means of instruction-level test coverage. Test programs are constructed by combining test situations for different sequences of instructions.
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تاریخ انتشار 2009